Defect ordering in epitaxial a-GaN(QQ01)

نویسندگان

  • H. Z. Xiao
  • N.-E. Lee
  • R. C. Powell
  • Z. Ma
  • L. J. Chou
  • L. H. Allen
  • J. E. Greene
چکیده

The microstructure of nominally undoped epitaxial wurtzite-structure o-GaN films, grown by gas-source molecular-beam epitaxy, plasma-assisted molecular-beam epitaxy, and metalorganic chemical-vapor deposition, has been investigated by transmission electron microscopy (TEM) and high-resolution TEM. The results show that undoped a-GaN films have an ordered point-defect structure. A model of this defect-ordered microstructure, based upon a comparison between experimental results and computer simulations, is proposed.

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تاریخ انتشار 1999